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Creating Graphene p-n Junctions Using Self-Assembled Monolayers

机译:使用自组装单层创建石墨烯p-n结

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摘要

3-Aminopropyltriethoxysilane (APTES) and perfluorooctyltriethoxysilane (PFES) were used to modify the interface between transferred CVD graphene films and its supporting dielectric to create n-type and p-type graphene, respectively. A graphene p—n junction was obtained by patterning both modifiers on the same dielectric and verified through the creation of a field effect transistor (FET). Characteristic I—V curves indicate the presence of two separate Dirac points which confirms an energy separation of neutrality points within the complementary regions. This method minimizes doping-induced defects and results in thermally stable graphene p—n junctions for temperatures up to 200 °C.
机译:使用3-氨丙基三乙氧基硅烷(APTES)和全氟辛基三乙氧基硅烷(PFES)来修饰转移的CVD石墨烯薄膜与其支撑电介质之间的界面,分别生成n型和p型石墨烯。石墨烯PN结是通过在同一电介质上对两个改性剂进行构图而获得的,并通过创建场效应晶体管(FET)进行了验证。特征IV曲线表明存在两个分离的狄拉克点,这证实了互补区域内中性点的能量分离。这种方法最大程度地减少了掺杂引起的缺陷,并在高达200°C的温度下形成了热稳定的石墨烯PN结。

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