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A Method to Improve Electrical Properties of BiFeO3 Thin Films

机译:一种改善BiFeO3薄膜电性能的方法

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A method is used to improve the electrical properties of BiFeO3 thin films by modifying the Bi content in ceramic targets, where all thin films were prepared on SrRuO3/Pt/TiO2/SiO2/Si(l00) substrates by radio frequency sputtering. The Bi content in the ceramic target strongly affects the electrical properties of BiFeO3 thin films. BiFeO3 thin films prepared by using the ceramic target of Bi/Fe ≈ 1.15 with a molar ratio demonstrate a low leakage current density and a low dielectric loss. Moreover, a larger remanent polarization of 2P_r≈ 167.6 μC/cm~2 is also demonstrated for the BiFeO3 thin films prepared by using the ceramic target of Bi/Fe ≈ 1.15, together with an improved fatigue behavior. Therefore, it is an effective way to improve the electrical properties of bismuth ferrite thin films by modifying the Bi content in ceramic targets.
机译:一种用于通过改变陶瓷靶中的Bi含量来改善BiFeO 3薄膜的电性能的方法,其中所有薄膜均通过射频溅射在SrRuO 3 / Pt / TiO 2 / SiO 2 / Si(100)衬底上制备。陶瓷靶中的Bi含量会强烈影响BiFeO3薄膜的电性能。通过使用摩尔比为Bi / Fe≈1.15的陶瓷靶材制备的BiFeO3薄膜具有低漏电流密度和低介电损耗。此外,还证明了使用Bi / Fe≈1.15陶瓷靶材制备的BiFeO3薄膜具有更大的2P_r≈167.6μC/ cm〜2剩余极化,并改善了疲劳性能。因此,通过改变陶瓷靶中的Bi含量,是改善铋铁氧体薄膜电性能的有效途径。

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