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Electronic structure change of NiS2-x Se (x) in the metal-insulator transition probed by X-ray absorption spectroscopy

机译:X射线吸收光谱法探测金属绝缘体过渡中NIS2-X SE(X)的电子结构变化

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The electronic structure change of NiS2-x Se (x) as a function of Se concentration x has been studied by Ni L-edge X-ray absorption spectroscopy (XAS). The XAS spectra show distinct features in Ni L (3) edge, indicating whether the system is insulating or metallic. These features can be semi-quantitatively explained within the framework of the configurational interaction cluster model (CICM). In the S-rich region, relatively large charge-transfer energy (Delta similar to 5 eV) from ligand p to Ni 3d states and a little small p-d hybridization strength (V (pd sigma) similar to 1.1 eV) can reproduce the experimental spectra in the CICM calculation, and vice versa in the Se-rich region. Our analysis result is consistent with the Zaanen-Sawatzky-Allen scheme that the systems in S-rich side (x = 0.5) are a charge transfer insulator. However, it also requires that the Delta value must change abruptly in spite of the small change of x near x = 0.5. As a possible microscopic origin, we propose a percolation scenario where a long range connection of Ni[(S,Se)(2)](6) octahedra with Se-Se dimers plays a key role to gap closure.
机译:NI L边缘X射线吸收光谱(XAs)研究了作为Se浓度X的功能的NIS2-X SE(x)的电子结构变化。 XAS光谱显示NI L(3)边缘中的不同特征,指示系统是绝缘还是金属。这些特征可以在配置交互集群模型(CICM)的框架内半定量说明。在富含S的地区,从配体P到Ni 3D状态的相对大的电荷转移能量(Δ类似于5eV)和略小的Pd杂交强度(类似于1.1eV的V(Pd Sigma))可以再现实验光谱在CICM计算中,反之亦然。我们的分析结果与Zaanen-Sawatzky-allen方案一致,即S富侧侧的系统(x& = 0.5)是电荷传输绝缘体。然而,它还要求增量值必须突然变化,尽管x近x = 0.5°近的x变化很小。作为可能的显微来源,我们提出了一种渗透场景,其中Ni [(SE,SE)(2)](2)](6)八面体与SE-SE二聚体的长距离连接起到间隙闭合的关键作用。

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