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Pulse mode operation of silicon diode for low temperature measurements below 20K

机译:用于低温测量的硅二极管的脉冲模式操作低于20K

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摘要

A Personal Computer compatible add-on-card for low temperature measurements below 10 K using a silicon diode sensor in pulse mode operation has been designed, fabricated and tested at the Materials Science Division, Indira Gandhi Center for Atomic Research, Kalpakkam. The design permits pulse mode biasing of the silicon diode and the acquisition of amplified voltage drop across the diode through a 12-bit ADC to the PC bus. The pulse mode biasing of the silicon diode prevents self-heating of the sensor especially when it is below 20 Kelvin and this enhances the sensitivity of the silicon diode sensor at very low temperatures. The amplified diode signal and the subsequent 12 bit conversion provides a high resolution measurement with good linearity and stability. The performance of this card compares excellently with steady state biasing.
机译:设计,在脉冲模式操作中设计,制作和测试了低温测量的个人计算机兼容的卡片,用于低温测量的低温测量值,在脉冲模式操作中设计,制造和测试了Indira Gandhi原子研究中心Kalpakkam。 该设计允许硅二极管的脉冲模式偏置并通过12位ADC到PC总线对二极管的放大电压降的采集。 硅二极管的脉冲模式偏置防止了传感器的自加热,特别是当它低于20个开尔文时,这增强了硅二极管传感器在非常低温下的灵敏度。 放大的二极管信号和随后的12位转换提供了具有良好线性度和稳定性的高分辨率测量。 此卡的性能与稳态偏置有效地比较。

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