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Electron Temperature Measurement Using PIN Diodes as Detectors to Record the X-ray Pulses from a Low-Energy Mather-Type Plasma Focus

机译:使用PIN二极管作为检测器的电子温度测量,以记录来自低能量马瑟式等离子体焦点的X射线脉冲

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In the experiment to determine the plasma electron temperature, a modified multichannel PIN diodes assembly is used as detectors to record the X-ray pulses from a low-energy Mather-type plasma focus device energized by a 32μF, 15 kV (3.6kJ) single capacitor, with deuterium as a filling gas. The ratio of the integrated bremsstrahlung emission transmitting through foils to the total incident flux as a function of foil thickness at various temperatures is obtained for foil absorbers of material. Using 3 μm, 6 μm, 9 μm,12 μm,15 μm and 18 μm thick aluminium absorbers, the transmitted X-ray flux is detected. By comparing the experimental and theoretical curves through a computer program, the plasma electron temperature is determined. Results show that the deuterium focus plasma electron temperature is about 800 eV.
机译:在确定等离子体电子温度的实验中,使用改进的多通道PIN二极管组件作为检测器,以记录由32μF,15 kV(3.6kJ)单脉冲激发的低能量马瑟型等离子体聚焦装置产生的X射线脉冲电容器,以氘作为填充气体。对于材料的箔吸收剂,获得了在不同温度下透射通过箔的集成致辐射发射与总入射通量之比,其为箔厚度的函数。使用3μm,6μm,9μm,12μm,15μm和18μm厚的铝吸收剂,可以检测透射的X射线通量。通过计算机程序比较实验曲线和理论曲线,可以确定等离子体电子温度。结果表明,氘聚焦等离子体电子温度约为800 eV。

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