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Point focusing device for ultra-short X-ray impulses, e.g. for creating high-intensity X-rays for scientific investigations, has an elliptical reflective surface placed at the focus of X-ray source and detector
Point focusing device for ultra-short X-ray impulses, e.g. for creating high-intensity X-rays for scientific investigations, has an elliptical reflective surface placed at the focus of X-ray source and detector
Device for point-focusing of X-radiation has a curved reflecting working surface placed in the focal planes of both X-ray source and receiver to focus the emitted radiation. To avoid beam path differences between the point-type radiation source, the curved working surface and the beam focus, the working surface has an essentially elliptical shape, which has a crystal surface that is relevant for Bragg reflection and is positioned at the focal points of emitter and receiver.
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