Measurement of the junction temperature of hyper-frequency components, such as bipolar transistors used in radar applications, operating in continuous pulsed mode, by application of an impulse sequence and temperature measurement

摘要

Test method for a hyper-frequency component junction applies a sequence of hyper-frequency impulses of increasing duration to a component. The power of the impulses is representative of a component operating state. The junction temperature is measured at the end of each impulse to obtain a representative curve (42) of the evolution of junction temperature as a function of time. The invention also relates to a circuit for generation of the hyper-frequency impulses and making the necessary temperature measurements and recording the characteristic junction temperature curve.