The Interplay of Contact Layers: How the Electron Transport Layer Influences Interfacial Recombination and Hole Extraction in Perovskite Solar Cells

摘要

Charge-selective contact layers in perovskite solar cells influence the current density–voltage hysteresis, an effect related to ion migration in the perovskite. As such, fullerene-based electron transport layers (ETLs) suppress hysteresis by reducing the mobile ion concentration. However, the impact of different ETLs on the electronic properties of other constituent device layers remains unclear. In this Kelvin probe force microscopy study, we compared potential distributions of methylammonium lead iodide-based solar cells with two ETLs (planar TiO_(2) and C60-functionalized self-assembled monolayer) with different hysteretic behavior. We found significant changes in the potential distribution of the organic hole transport layer spiroMeOTAD, suggesting the formation of a neutral spiroMeOTAD/iodide interface due to a reaction between iodide with p-doped spiroMeOTAD in the TiO_(2) cell. Our results show that the ETL affects not only the mobile ion concentration and the recombination at the perovskite/ETL interface but also the resistance and capacitance of the spiroMeOTAD.