Opposed-view spatially multiplexed interferometric microscopy

摘要

The capability for simultaneous recording of light which is transmitted and reflected by a sample has big potential in microscopy. In this paper, we introduce opposed-view spatially multiplexed interferometric microscopy (OV-SMIM) as the combination of transmission and reflection (transflective) imaging modalities into a digital holographic microscopy platform. The implementation is in virtue of wavelength multiplexing for allowing simultaneous retrieval of quantitative phase information of the inspected sample. OV-SMIM generalizes a SMIM concept and provides an extremely simple, low cost and highly stable way to convert a bright field microscope into a holographic one with the functionality of transflective imaging. Experimental validation is presented for a regular Olympus BX-60 upright microscope considering chromium coated patterns and microbeads.