Rapid and nondestructive analysis of deep-fried taro chip qualities using near infrared spectroscopy

摘要

The objective of this study was to use near infrared spectroscopy to determine the moisture and fat content, color properties and maximum force of break of deep-fried taro chips as a rapid and non-destructive technique. Near infrared spectra were recorded on intact taro chips in the wavelength range of 1100-2500 nm collected using a near infrared spectrometer, followed by quality attribute measurements. The near infrared calibration models were developed individually using partial least square regression. The partial least square calibration models were found to have coefficients of determination (R-2) between 0.85 and 0.97 and for independent samples the ratio of prediction to deviation ranged from 2.0 to 4.9. The results indicated that near infrared spectroscopy offers a fast, simple, accurate and nondestructive method to determine the quality of intact, deep-fried taro chips. Therefore, it can be used in-line or at-line for the quality control of the deep-fried process and for better monitoring of changes in the chemical and physical properties of fried products during processing.