Atom trap trace analysis of krypton in xenon for the XENON Dark Matter Project

摘要

We report on the first atom trap trace analysis (ATTA) measurements of Kr inXe samples with Kr/Xe concentrations of O(10 ppt)~3 and O(100 ppt). The ATTA results were independently confirmed by measurements of the same samples with a rare gas mass spectrometer. Measurements of samples with Kr/Xe concentrations below these levels were inhibited by a residual Kr background in the ATTA apparatus, attributed to a cumulative cross sample contamination due to the radio frequency plasma discharge source region from tests with Kr-rich gas samples.