...
首页> 外文期刊>Journal of instrumentation: an IOP and SISSA journal >Dual time-over-threshold: estimation of decay time and pulse height for scintillation detectors
【24h】

Dual time-over-threshold: estimation of decay time and pulse height for scintillation detectors

机译:双超时阈值:闪烁探测器的衰减时间和脉冲高度的估计

获取原文
获取原文并翻译 | 示例

摘要

To linearly estimate the decay time and pulse height of a scintillation detector with low power consumption, a dual time-over-threshold (dual-ToT) method is proposed in this paper. The results of comparative experiments conducted using a 3 × 3 × 3mm~3 LYSO crystal and 3 × 3mm~2 MPPC with 50 μm cells indicated that the resolution of the estimated decay time using the dual-ToT method was 3.8 ns standard deviation (SD), whereas 3.5 ns SD was obtained using fully digitized waveforms. Additionally, a linear relationship between the dual-ToT-based and the analog-to-digital converter (ADC)-based pulse height was successfully observed. The estimated pulse height resolution using the dual-ToT method and post analysis technique was 12-13% FWHM at 511 keV, which is comparable to that of the ADC-based measurement. These capabilities potentially indicate that the dual-ToT method could be an alternative to the ADC method, with the advantage of lower power consumption and being applicable to the phoswich detector and particle identification applications.
机译:为了线性估计具有低功耗的闪烁检测器的衰减时间和脉冲高度,本文提出了一种双时间过度阈值(双Tot)方法。使用3×3×3mm〜3 leyso晶体进行的比较实验结果和50μm细胞的3×3mm〜2 mppc表明,使用双层方法的估计衰减时间的分辨率为3.8 ns标准偏差(SD ),而使用完全数字化波形获得3.5 ns SD。另外,成功地观察到基于Dual-To-To-Digital转换器(ADC)的脉冲高度之间的线性关系。使用双层法和后分析技术的估计脉冲高度分辨率为12-13%的FWHM,511 KeV,其与基于ADC的测量相当。这些能力可能表明双层方法可以是ADC方法的替代方法,其中功耗较低,适用于铜线检测器和粒子识别应用。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号