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首页> 外文期刊>Journal of instrumentation: an IOP and SISSA journal >Experimental performance of a highly-innovative low-noise charge-sensitive preamplifier with integrated range-booster
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Experimental performance of a highly-innovative low-noise charge-sensitive preamplifier with integrated range-booster

机译:具有集成范围 - 助推器的高度创新低噪声电荷敏感前置放大器的实验性能

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摘要

Integrated charge-sensitive preamplifiers suffer from a reduced available dynamic range respect to discrete-type equivalents. This is due to the limits on maximum supply voltages that modern scaled technologies can tolerate. In this work we present a low-noise low-power integrated charge-sensitive preamplifier (CSP) for solid-state detectors. This device is equipped with an integrated range-booster that can enhance the spectroscopic range of the preamplifier by more than one order of magnitude, enabling high-resolution spectroscopy even if the preamplifier is in deep saturation condition. If the input signals from the detector are under the natural saturation threshold (40MeV), the preamplifierworks in an usual linearway, producing at the output the typical exponential signals. With proper filtering a resolution of approximately 1 keV is achievable. When a large signal from the detector saturates the preamplifier, a sensing circuit detects the saturation and switches the operation mode of the CSP to the "fast-reset mode". In this mode a constant and controlled current generator discharges the input node of the preamplifier until the normal operating point is reached. Meanwhile an auxiliary circuit similar to a TAC (Time-to-Amplitude converter) retrieves the energy of the signal that caused saturation. Although the natural dynamic range of the CSP is 40MeV, the fast-reset mode enables for high-resolution spectroscopy (under 0.2% FWHM) up to several hundreds of MeV (700MeV typically). One issue in this kind of circuits is the dependence of the energy measured with the TAC circuit on the baseline value of the CSP before the "fast-reset event" [5]. As a solution to this problem we propose a correction algorithm implemented inside the TAC block in the form of an analog circuit. On a test-bench a series of large 3 pC charge signals is injected in the input node of the preamplifier through a test capacitor. Before these events, residual charges ranging from 0 to 0.56 pC pr
机译:集成的电荷敏感前置放大器遭受可用动态范围的尊重减少,尊重离散类型等价物。这是由于现代缩放技术可以容忍的最大电源电压的限制。在这项工作中,我们为固态检测器提供了一个低噪声低功耗集成电荷敏感前置放大器(CSP)。该装置配备有集成的范围 - 增强器,可以通过一个以上的级别增强前置放大器的光谱范围,从而实现高分辨率光谱,即使前置放大器处于深度饱和条件。如果来自检测器的输入信号位于自然饱和阈值(40mev)下,则前导措施是一种通常的线轴,在输出时产生典型的指数信号。适当过滤,可实现约1 keV的分辨率。当来自检测器的大信号使前置放大器饱和时,感测电路检测饱和度并将CSP的操作模式切换到“快速复位模式”。在该模式中,恒定和受控电流发生器将前置放大器的输入节点放电,直到达到正常操作点。同时,类似于TAC的辅助电路(时间 - 幅度转换器)检索导致饱和的信号的能量。尽管CSP的自然动态范围是40mev,但快速复位模式可用于高分辨率光谱(0.2%fwhm),高达数百MEV(通常为700mev)。这种电路中的一个问题是在“快速复位事件”[5]之前,在CSP的基线值上使用TAC电路测量的能量的依赖性。作为解决此问题的解决方案,我们提出了一种以模拟电路的形式在TAC块内实现的校正算法。在测试台上,通过测试电容将一系列大的3个PC充电信号注入前置放大器的输入节点。在这些事件之前,剩余电荷范围为0到0.56 PR

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