Metric-Driven Verification Methodology with Regression Management

摘要

This paper discusses the regression testing in digital integrated circuit verification. The aim of the metric-driven verification (MDV) and its role in modern verification methodology is presented. According to recognized limitations, it is proposed to include the regression testing strategy in verification environment itself. The data collected from the verification metrics can be used to adjust the testing procedures during the simulation. This approach allows for a dynamic management of the regression testing structure and may result in a significant reduction of the simulation time. The presented solution introduces a concept of the test segments. They may be started at arbitrary simulation point related to the DUT internal state (checkpoint). Usage of such segments, in the controlled regression testing strategy, may prevent from repeating the stimuli which is not contributing to the pre-defined verification metrics.