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Ohmic graphite-metal contacts on oxygen-terminated lightly boron-doped CVD monocrystalline diamond

机译:欧姆石墨金属触点氧封端轻硼掺杂CVD单晶金刚石

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摘要

A process to obtain ohmic contacts on oxygen-terminated lightly boron-doped CVD monocrystalline diamond films was developed. Samples were contacted by Ti/Au metallic pads in the transmission line model (TLM) configuration. The electric contacts were placed onto a mesa structure produced on the CVD boron-doped layer. One of the samples was additionally implanted with helium ions at 10 keV in order to induce the formation of a graphitic layer underneath the diamond surface before contacting so as to improve electrical conduction. The electrical performance of both devices was characterized by the TLM method and compared. As a result, the sample with metallic electrodes exhibited a small and non-linear electrical conduction, while the graphitic/metallic contacts showed an ohmic behaviour with an estimated specific contact resistance as low as 3.3 x 10(-4) Omega.cm(2) for a doping level of a few 10(17) cm(-3). This approach opens the way to more efficient ohmic contacts on intrinsic or low-doped diamond that are crucial for the development of electronic devices and detectors.
机译:产生在氧封端的轻质硼掺杂CVD单晶金刚石膜上获得欧姆接触的方法。在传输线模型(TLM)配置中通过Ti / Au金属焊盘接触样品。将电触点放置在CVD硼掺杂层上产生的MESA结构上。将其中一种样品在10keV下另外用氦离子植入,以在接触之前诱导金刚石表面下方的石墨层的形成,以改善电导。两种器件的电气性能的特征在于TLM方法并进行比较。结果,具有金属电极的样品表现出小而非线性导电,而石墨/金属触点显示欧姆行为,估计的特异性接触电阻低至3.3×10(-4)ωcm(2 )对于少数10(17)厘米(-3)的掺杂水平。这种方法在内在或低掺杂钻石上开辟了更有效的欧姆接触,这对于开发电子设备和探测器至关重要。

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