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机译:A-Si的结构和光电性质:H:基于光谱椭圆形测量的新分析
Key Laboratory of Instrumentation Science and Dynamic Measurement North University of China;
State Key Laboratory of Electronic Thin Films and Integrated Devices University of Electronic Science and Technology of China;
State Key Laboratory of Electronic Thin Films and Integrated Devices University of Electronic Science and Technology of China;
Key Laboratory of Instrumentation Science and Dynamic Measurement North University of China;
Key Laboratory of Instrumentation Science and Dynamic Measurement North University of China;
Key Laboratory of Instrumentation Science and Dynamic Measurement North University of China;
Key Laboratory of Instrumentation Science and Dynamic Measurement North University of China;
a-Si:H; Thin film; Spectroscopic ellipsometry; DOS; Dielectric function;
机译:A-Si的结构和光电性质:H:基于光谱椭圆形测量的新分析
机译:实时椭偏仪结合虚拟界面分析检测a-Si:H薄膜中的光学梯度
机译:光谱椭偏仪分析InP上氧化膜的光学和结构性质
机译:实时光谱椭圆椭圆形研究A-Si:基于H的太阳能电池
机译:光谱椭偏仪作为薄膜中光学,电学和结构特性的多功能,非接触式探针:在光伏中的应用
机译:使用cor叶和种子的提取物生物合成的银基杂化纳米结构的微观结构,光谱学和抗菌特性
机译:通过实时光谱椭圆测定法测定的钼薄膜的电子和结构性