Hidden information in principal component analysis of ToF-SIMS data: On the use of correlation loadings for the identification of significant signals and structure elucidation

摘要

In this paper, an improved approach to interpret results of principal component analysis (PCA) of time-of-flight secondary ion mass spectrometry (ToF-SIMS) spectra is presented. Signals are typically observed in different intensity ranges in a single ToF-SIMS spectrum due to different sensitivity factors and surface concentrations. This can complicate the PCA interpretation, because loadings are reported to be strongly affected by these intensity changes. In contrast, it is shown here that correlation loadings are unaffected by these differences. In particular, correlation loadings were successfully used to identify signals with relatively low intensity but high significance. These signals may be overlooked when only loadings are used. This is particularly true in failure analysis, where ToF-SIMS is used to screen for initially unknown signals that may be relevant for the characteristics/failure of a product. As a model study, the concept was applied to investigate ageing of Li-ion batteries by ToF-SIMS. In this data set, the significance of impurities that affect the quality of Li-ion batteries was identified only by correlation loadings, whereas the loadings were found to overestimate the influence of other matrix signals. In addition, correlation loadings aid in the chemical identification and helped to successfully assign unknown peaks.