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Laser irradiation-induced structural, microstructural and optical properties change in Bi-doped As40Se60 thin films

机译:激光照射诱导的双掺杂AS40se60薄膜中的结构,微观结构和光学性能变化

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The laser irradiation with band gap light of thermally evaporated As40Se55Bi5 and As40Se45Bi15 thin films was found to be accompanied by structural changes which in turn changed the optical constant. The thin films under investigation were characterized by the X-ray diffraction method to study the structural change and the surface morphology was checked by field emission scanning electron microscope. The composition of the films was verified from the energy dispersive X-ray analysis. The changes in optical properties due to the influence of laser irradiation were calculated from the transmission spectrum recorded by UV-Visible spectrometer in the wavelength region 400-1200nm. The decrease in optical band gap (photodarkening) is explained on the basis of density of state model proposed by Mott-Davis. The Raman analysis showed the Raman shift and symmetric stretching vibration of As-Se.
机译:发现具有热蒸发的AS40Se55Bi5和As40se45Bi15薄膜的带隙光的激光照射伴随着结构变化,又改变了光学常数。 通过X射线衍射方法研究进行研究的薄膜,以研究结构变化,通过场发射扫描电子显微镜检查表面形态。 从能量分散X射线分析验证膜的组成。 由于波长区域400-1200nm中的UV可见光光谱仪记录的透射光谱计算导致的光学性质的变化。 基于Mott-Davis提出的状态模型的密度来解释光带间隙(光映像)的降低。 拉曼分析显示了AS-SE的拉曼移位和对称拉伸振动。

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