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Enhancement of thermoelectric properties of sulphurized CZTS nano-crystals by the engineering of secondary phases

机译:通过次生工程增强硫化CZTS纳米晶体的热电性能

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In this manuscript, we have explored the potential of Copper Zinc Tin Sulfide (CZTS) nano-crystals for thermoelectric power generation application by the engineering of secondary phases. CZTS nano-crystals were grown on various substrates (crystalline silicon (c-Si), multi-crystalline silicon (mc-Si), Soda Lime Glass (SLG) and Indium Tin Oxide (ITO) coated glass) using sol-gel solution technique. The grown samples were sulphurized in tube furnace at 500C for 20 min under vacuum. It was observed that sample grown on me-Si has highest Seebeck coefficient of 667 mu V/C-0 while sample grown on ITO substrate has the lowest value of Seebeck coefficient (70 mu V/C-0) at measurement temperature 100 degrees C. The reported high Seebeck coefficient of CZTS/mc-Si sample is related to the emergence of secondary phases. To verify this argument, we have performed XRD, Raman spectroscopy and UV/Visible measurements. XRD data revealed the presence of (112), (103) and (220) phases of CZTS in all samples but CZTS/mc-Si and CZTS/c-Si samples demonstrated additional phases related to secondary phases. Raman spectroscopy was also used to verify the presence of secondary phases in CZTS/mc-Si. Raman measurements showed that all samples consisted of CZTS vibration mode at 329 cm(-1) but CZTS/mc-Si and CZTS/c-Si have additional secondary phases due to CuxS, CuSnS and SnxS vibration modes. UV-Vis data also verified our argument that Seebeck coefficient was enhanced due to secondary phases engineering using various substrates for CZTS growth.
机译:在该稿件中,我们已经探讨了次级阶段工程的热电发电应用的铜锌硫化锌(CZT)纳米晶体的潜力。使用溶胶 - 凝胶溶液技术在各种基材(结晶硅(C-Si),多晶硅(C-Si),多晶硅硅(MC-Si),钠钙玻璃(SLG)和铟锡氧化铟锡(ITO)涂覆玻璃上生长纳米晶体。在真空下,生长的样品在管炉中在管炉中硫化20分钟。观察到ME-Si上生长的样品具有最高的塞贝克系数667μV/ C-0,而ITO衬底生长的样品在测量温度下具有塞贝克系数(70μmV/ C-0)的最低值100度C. 。报道的CZTS / MC-Si样品的高塞贝克系数与二次阶段的出现有关。要验证此参数,我们执行了XRD,拉曼光谱和UV /可见测量。 XRD数据显示所有样品中的(112),(103)和(220)阶段的存在,但CZTS / MC-Si和CZTS / C-Si样品显示出与二次相有关的另外的相。拉曼光谱还用于验证CZTS / MC-Si中的二次相的存在。拉曼测量表明,所有样品由CZTS振动模式组成,在329cm(-1),但CZTS / MC-Si和CZTS / C-Si由于货币,CUSN和SNXS振动模式而具有额外的二次阶段。 UV-Vis数据还验证了我们的论点,即由于使用各种基材的二次阶段工程而增强了Seebeck系数,用于CZTS生长。

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