Abstract <![CDATA[Cu <ce:inf loc='post'>2</ce:inf>ZnSn(S <ce:inf loc='post'>x</ce:inf>Se <ce:inf loc='post'>1</ce:inf> <ce:inf loc='post'>?x</ce:inf>) <ce:inf loc='post'>4</ce:inf> thin film solar cell with high sulfur content (x approximately 0.4) and low V <ce:inf loc='post'>oc</ce:inf> deficit prepared using a postsulfurization process]]>
首页> 外文期刊>Solar Energy Materials and Solar Cells: An International Journal Devoted to Photovoltaic, Photothermal, and Photochemical Solar Energy Conversion >2ZnSn(S xSe 1 ?x) 4 thin film solar cell with high sulfur content (x approximately 0.4) and low V oc deficit prepared using a postsulfurization process]]>
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2ZnSn(S xSe 1 ?x) 4 thin film solar cell with high sulfur content (x approximately 0.4) and low V oc deficit prepared using a postsulfurization process]]>

机译:<![cdta [with 2 znsn(s x se 1 ?X 4 薄太阳膜电池高硫含量(x约0.4)和低V OC 使用Postsulfulation Process制备]]>

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AbstractHigh-efficiency (11.1%) Cu2ZnSn(SxSe1?x)4(CZTSSe) solar cells have been obtained only with low-sulfur absorbers because the incorporation of high sulfur content is typically accompanied by a large open-circuit voltage (Voc) deficit. In this research, a sulfur content of 40% (x = 0.4) was obtained by postsulfurization. In comparison with a low-sulfur CZTSSe with x = 0.13, an efficiency of 9.8%, a band gap of 1.05eV, and a Vocof 446mV, the proposed cell had an efficiency of 11.1%, a band gap of 1.2eV and a Voc of 578mV; the post-sulfurization caused a very small increase in the Vocdeficit (approximately 18mV). Approximately 250-nm-thick S-rich CZTSSe layer was found near the surface and was close to the depletion width (approximately 238.5nm) of the p-n junction, indicating a double-layered CZTSSe included a high-sulfur top layer was responsible for the high Voc. Admittance spectroscopy showed the activation energy of the bulk defect was 138meV; this revealed some deep-level defects were associated with the low short-circuit current at long wavelengths. The activation energy of the interfacial defects was 1.08eV, indicating the Vocdeficits of future devices may be decreased by suitable surface treatment of high-sulfur-content CZTSSe devices.Highlights
机译:<![cdata [ 抽象 高效(11.1%)CU 2 ZNSN(SXSE1?x ) 4 (CZTSSE)太阳能电池仅通过低硫吸收剂获得,因为高硫含量的掺入通常伴随着大开关电压( v OC )缺陷。在该研究中,通过抵抗硫化得到40%(x = 0.4)的硫含量。与X = 0.13的低硫CZTSSE相比,效率为9.8%,1.05EV的带隙,AV OC 的446mV,提出的细胞的效率为11.1%,带隙1.2eV的带隙,VOC为578mV;后硫化导致V OC 赤字(约18mV)增加。在表面附近发现了大约250nm厚的S浓的CZTSSE层,靠近PN结的耗尽宽度(约238.5nm),表示包括高硫顶层的双层CZTSSE负责HIGH V OC 。导纳光谱显示散装缺陷的激活能量为138mev;这揭示了一些深度缺陷与长波长的低短路电流相关联。界面缺陷的激活能量为1.08EV,表示V OC 未来设备的缺陷,通过合适的高硫含量CZTSSE器件的表面处理可能会降低。 突出显示

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