首页> 外文期刊>Shape memory and superelasticity >Assessment of Entropy Differences from Critical Stress Versus Temperature Martensitic Transformation Data in Cu-Based Shape-Memory Alloys
【24h】

Assessment of Entropy Differences from Critical Stress Versus Temperature Martensitic Transformation Data in Cu-Based Shape-Memory Alloys

机译:基于Cu基形状记忆合金中临界应力与温度马氏体变换数据的熵差异的评估

获取原文
获取原文并翻译 | 示例
           

摘要

The entropy differences per unit volume (ΔS~(trans)) between the close-packed phases in a martensitic transformation (MT) in Cu-based shape-memory alloys are obtained from mechanical tests by measuring, as a function of temperature (T), the critical resolved stress (τ). Specifically, ΔS~(trans) values are obtained from the slope of τ versus T plots by invoking a relation which is straightforwardly derived from the classical Clausius-Clapeyron equation, viz., ds dτ/dT=-ΔS~(trans)/γ, where γ is the transformation shear strain. Motivated by the significant scatter of the so obtained ΔS~(trans) values, the thermodynamic bases of such evaluation procedure have been revised, by accounting for the nucleation step of a martensite plate. The interface, elastic strain, and chemical contributions to the Gibbs energy of nucleation have been considered. A new expression of the type dτ/dT=Ω-ΔS~(trans)/γ is obtained, where the Ω term involves the elastic properties and their temperature dependence. The new τ-T-ΔS~(trans) relation is used to assess the ΔS~(trans) values corresponding to the 2H/18R and 18R/6R MTs in Cu-Al-Ni and Cu-Zn-Al alloys. The ΔS~(trans) values obtained by the present approach fall on a scatter band centered around the zero value.
机译:Cu基形状记忆合金中的马氏体变换(MT)中的近填充相之间的每单位体积(Δs〜(反式))通过测量,作为温度(t)的函数获得机械测试。 ,临界分辨应力(τ)。具体地,通过调用从经典Clausius-Clapeyron方程,VIZ直截了当的关系,从τ与T图的斜率获得Δs〜(跨)值。,dsdτ/ dt =-Δs〜(trans)/γ ,其中γ是变换剪切应变。通过所获得的ΔS〜(反式)值的显着散射,通过算用于马氏体板的成核步骤,已经修改了这种评估程序的热力学基础。已经考虑了界面,弹性应变和化学贡献的成核的核心能量。获得Dτ/ DT =ω-ΔS〜(反式)/γ的类型的新表达,其中ω项涉及弹性特性及其温度依赖性。新的τ-T-ΔS〜(反式)关系用于评估与Cu-Al-Ni和Cu-Zn-Al合金中的2H / 18R和18R / 6R MTS对应的ΔS〜(反式)值。通过本方法获得的ΔS〜(跨)值落在围绕零值的散射带上。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号