Analysis and Validation of TFT-LCD RGB Mura Mechanism

Tianfu Chen; Zhongxiu Li; Deqin Shi; Huijun Jin; Xianjun Huang

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Analysis and Validation of TFT-LCD RGB Mura Mechanism

机译：TFT-LCD RGB Mura机制的分析与验证

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摘要

The influence of photo spacer design and polyimide layer adhesion on RGB mura risk for LCD panels is studied. A method to assess RGB mura risk is developed with corresponding design standards to ensure product reliability requirements are met.

机译：研究了光间隔设计和聚酰亚胺层粘附对液晶面板RGB Mura风险的影响。评估RGB Mura风险的方法采用相应的设计标准开发，以确保满足产品可靠性要求。

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来源
《SID International Symposium: Digest of Technology Papers》 |2018年第3期|共3页
作者
Tianfu Chen; Zhongxiu Li; Deqin Shi; Huijun Jin; Xianjun Huang;
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作者单位

Tianma Micro-electronics Co. Ltd.;

Tianma Micro-electronics Co. Ltd.;

Tianma Micro-electronics Co. Ltd.;

Tianma Micro-electronics Co. Ltd.;

Tianma Micro-electronics Co. Ltd.;

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原文格式 PDF
正文语种 eng
中图分类通信理论;
关键词
TFT-LCD; Pixel light-leaking; RGB mura; PI film;

机译：TFT-LCD;像素光泄漏;RGB Mura;PI薄膜;

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1. Analysis and Validation of TFT-LCD RGB Mura Mechanism [J] . Tianfu Chen, Zhongxiu Li, Deqin Shi, SID International Symposium: Digest of Technology Papers . 2018,第3期

机译：TFT-LCD RGB Mura机制的分析与验证
2. Mechanism Analysis and Improvement of Corner Light leakage for Small Size TFT-LCD [J] . Peng Cai, Yang Wang, Yongliang Zhao, SID International Symposium: Digest of Technology Papers . 2019,第3期

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Analysis and Validation of TFT-LCD RGB Mura Mechanism

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