Generation of Dynamic Scenes for Testing Infrared Imaging Systems in the Far Infrared Range

摘要

An important aspect of the development of specialized test rigs for monitoring and estimating information system parameters is the use of devices for test field generation. Simulation rigs based on micromirror modulators capable of real-time generation of dynamic (tunable) images are considered in the present study. For such modulators to be used in the long-wave infrared range of the spectrum, they are upgraded by means of replacement of usual protective glasses by materials that are transparent in the infrared range up to the wavelength of 14 μ m. Structural features of the test rigs are considered on the basis of the description of micromirror modulators in the form of echelettes (diffraction gratings with a saw-tooth shape of the grooves). Experimental results are presented. The ability of upgraded modulators to operate within infrared simulation rigs is demonstrated. Such devices offer certain prospects for the development of advanced systems for monitoring and dynamic testing of infrared photodetectors.