Analysis of Dynamic Scene Generation Schemes in Testing of Infrared Imaging Systems

摘要

Devices used for testing of infrared imaging systems are briefly reviewed. Popular methods of dynamic scene generation in the infrared range, which are used in testing systems, and their basic parameters are presented. Approximate schemes of constructing such testing systems, based on arrays of controlled micromirrors and emitting elements, are described. A comparative analysis of the most popular testing systems is performed.