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首页> 外文期刊>Russian Chemical Bulletin >Chemical vapor deposition of boron-containing films using B(OAlk)(3) as precursors: thermodynamic modeling
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Chemical vapor deposition of boron-containing films using B(OAlk)(3) as precursors: thermodynamic modeling

机译:使用B(oalk)(3)作为前体的含硼薄膜的化学气相沉积:热力学建模

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Thermodynamic modeling of the process of chemical vapor deposition (CVD) of boron-containing films in the chemical system B-C-O-H was carried out. The possibility to use trialkyl borates B(OAlk)(3) (Alk = Et, Pr-i) and their mixtures with helium, hydrogen, and ammonia to fabricate films of different composition was demonstrated. The CVD phase diagrams of the systems in question were calculated. The nature of the boundaries on these sections was analyzed. The chemical reaction equations determining the position of such lines are derived. Chemical equilibria corresponding to these reactions can be used to control the CVD process.
机译:进行了化学体系B-C-O-H中含硼薄膜的化学气相沉积(CVD)的热力学建模。 用氦气,氢气和氨与用氦气,氢气和氨进行使用三烷基硼酸酯B(3)(3)(3)(Alk = Et,Pr-1)和它们的混合物。 计算有问题的系统的CVD相图。 分析了这些部分上边界的性质。 衍生确定这种线的位置的化学反应方程。 对应于这些反应的化学均衡可用于控制CVD方法。

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