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FUNCTIONAL EVALUATION OF COPPER IN CONVENTIONAL WIRE BONDING AS COMPARED TO GOLD

机译:与金相比,常规引线键合铜的功能评估

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In the wire bonding process, the ever increasing gold (Au) price has created a necessity for looking at alternate materials viz., copper (Cu) for wire bonding, allowing Cu wire bonding to make a dramatic progress in recent years. The trend to shift towards Cu wire is expected to advance further in future, thus further improvement of bonding technique is indispensable as there are many challenges viz., handling of fragile pad structure, peeling, cracking below the bond pad, high oxidation rate, hardness and lower bondability of the wire bonds. In this paper, a series of experiments and characterizations (Mechanical, Electrical & SEM (Scanning Electron Microscope) has been conducted with 1mil Au and Cu wires to experimentally prove that Cu is a reliable replacement for Au in wire bonding process.
机译:在电线键合过程中,越来越多的金(AU)的价格已经为替代材料的替代材料进行了必要性,铜(Cu)用于引线粘合,允许Cu线键合在近年来戏剧性的进展。 预计将来进一步推向Cu线的趋势,因此进一步提高粘接技术的进一步改善是必不可少的,因为脆弱的焊盘结构,剥落,粘接垫低于粘接率,高氧化率,硬度 和较低的线键的粘合性。 本文采用了一系列实验和表征(机械,电气和SEM(扫描电子显微镜),用1mil Au和Cu线进行了实验证明,Cu是在线键合过程中Au的可靠替代品。

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