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New Tetra-Schiff Bases as Efficient Photostabilizers for Poly(vinyl chloride)

机译:新的Tetra-Shiff碱是聚(氯乙烯)的高效光稳定剂

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摘要

Three new tetra-Schiff bases were synthesized and characterized to be used as photostabilizers for poly(vinyl chloride) (PVC) films. The photostability of PVC films (40 mu m thickness) in the presence of Schiff bases (0.5 wt %) upon irradiation (300 h) with a UV light (lambda(max) = 365 nm and light intensity = 6.43 x 10(-9) ein.dm(-3).s(-1)) was examined using various spectroscopic measurements and surface morphology analysis. The changes in various functional groups' indices, weight and viscosity average molecular weight of PVC films were monitored against irradiation time. The additives used showed photostability for PVC films, with Schiff base 1 being the most effective additive upon irradiation, followed by 2 and 3. The atomic force microscopy (AFM) images for the PVC surface containing Schiff base 1 after irradiation were found to be smooth, with a roughness factor (Rq) of 36.8, compared to 132.2 for the PVC (blank). Several possible mechanisms that explain PVC photostabilization upon irradiation in the presence of tetra-Schiff bases were proposed.
机译:合成了三个新的Tetra-Shiff碱基,并表征用作聚(氯乙烯)(PVC)膜的光稳定剂。 PVC膜(40μm厚)在筛选(300h)时在筛选碱(0.5wt%)存在下的光稳定性(300h),用UV光(Lambda(MAX)= 365nm和光强度= 6.43×10(-9 )使用各种光谱测量和表面形态分析检查EIN.DM(-3).S(-1))。监测PVC膜的各种官能团索引,重量和粘度平均分子量的各种官能团的变化抵抗照射时间。使用的添加剂显示出PVC膜的光稳定性,席克夫碱1是在照射时是最有效的添加剂,其次是2和3.发现在照射后的PVC表面的原子力显微镜(AFM)图像被发现光滑,粗糙度因子(RQ)为36.8,而PVC(空白)的132.2相比。提出了若干可能的机制,即解释在辐射存在Tetra-Schiff碱基的照射时PVC光稳定性。

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