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首页> 外文期刊>Microscopy and microanalysis: The official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada >Description of Ore Particles from X-Ray Microtomography (XMT) Images, Supported by Scanning Electron Microscope (SEM)-Based Image Analysis
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Description of Ore Particles from X-Ray Microtomography (XMT) Images, Supported by Scanning Electron Microscope (SEM)-Based Image Analysis

机译:来自X射线显微镜(XMT)图像的矿石颗粒的描述,通过扫描电子显微镜(SEM)基于图像分析

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In this paper, three-dimensional (3D) image data of ore particle systems is investigated. By combining X-ray microtomography with scanning electron microscope (SEM)-based image analysis, additional information about the mineralogical composition from certain planar sections can be gained. For the analysis of tomographic images of particle systems the extraction of single particles is essential. This is performed with a marker-based watershed algorithm and a post-processing step utilizing a neural network to reduce oversegmentation. The results are validated by comparing the 3D particle-wise segmentation empirically with 2D SEM images, which have been obtained with a different imaging process and segmentation algorithm. Finally, a stereological application is shown, in which planar SEM images are embedded into the tomographic 3D image. This allows the estimation of local X-ray attenuation coefficients, which are material-specific quantities, in the entire tomographic image.
机译:本文研究了矿石粒子系统的三维(3D)图像数据。 通过将X射线显微镜(SEM)的图像分析组合,可以获得有关来自某些平面部分的矿物学组合物的附加信息。 为了分析粒子系统的断层图像,单个颗粒的提取是必不可少的。 这是利用基于标记的流域算法和利用神经网络来减少过度处理的后处理步骤进行的。 通过用不同的成像过程和分割算法获得与2D SEM图像的经验验证的3D粒子明智的分割来验证结果。 最后,示出了立体学应用,其中平面SEM图像嵌入到断层扫描3D图像中。 这允许在整个断层图像中估计是特定于材料的局部X射线衰减系数。

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