Transmission electron microscopy and Rutherford backscattering spectrometry studies of Ag2Te films formed from Ag-Te thin film couples

摘要

Formation of Ag2Te thin films from room temperature (300 K) solid state reaction of Ag and Te thin film couples is investigated. Rutherford Backscattering Spectrometry (RBS) studies confirmed the complete miscibility of the couples and the stoichiometry of the resulting Ag2Te. Structural analysis by Transmission Electron Microscopy (TEM) showed a fine-grained structure with monoclinic and orthorhombic phases. Annealing at high temperatures resulted in the growth of giant crystallites with monoclinic phase at random sites.