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首页> 外文期刊>Materials Characterization >(110227)Study on preparation process of La_(1.89)Ce_(0.11)CuO_(4_x) film and junction characteristics of electron/hole superconductor heterostructure
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(110227)Study on preparation process of La_(1.89)Ce_(0.11)CuO_(4_x) film and junction characteristics of electron/hole superconductor heterostructure

机译:(110227)研究LA_(1.89)CE_(0.11)CUO_(4_X)薄膜和结特特征的制备方法研究电子/孔超导体异质结构

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摘要

In this work, the La_(1.89)Ce_(0.11)CuO_(4-x) (LCCO) film with good superconductivity is prepared on the basis of a close study on the process of fabricating the LCCO film via pulse laser deposition (PLD). The effects of heating, atmosphere, and annealing temperatures on the structure and superconducting properties of the LCCO film are studied, obtaining the optimal process that requires a deposition substrate temperature of 700 °C, an oxygen pressure of 30 Pa, and an annealing deoxygenation temperature of 600 °C. Subsequently, the electron/hole double-layer superconducting film (LCCO/YBa_2Cu_3O_(7-δ) (YBCO) bilayers) is obtained by preparing LCCO film on the YBCO film. The R-T tests show that the initial superconducting transition temperature (T_c) of the YBCO in the bilayers is about 45 K, and the T_c of the LCCO is near 16 K. The further testing of the LCCO/YBCO bilayers under ultraviolet irradiation reveals that the structure can produce salient photovoltaic phenomena. The pho-tovoltage and photocurrent experience a jump when the films undergo superconducting transition, indicating that the potential barrier at the LCCO/YBCO interface changes. This can be attributed to the transition of the interface barrier from a PN junction type to the Schottky junction type.
机译:在这项工作中,基于通过脉冲激光沉积(PLD)制造LCCO膜的过程的密切研究制备具有良好超导的LA_(1.89)CE_(0.11)CU_(0.11)CUO_(4-X)(LCCO)膜。研究了加热,大气和退火温度对LCCO膜的结构和超导性能的影响,获得了需要700℃的沉积基板温度,30Pa的氧气压力和退火的脱氧温度的最佳过程600°C。随后,通过在YBCO膜上制备LCCO膜来获得电子/空穴双层超导膜(LCCO / YBA_2CU_3O_(7-Δ)(YBCO)双层)。 RT测试表明,双层中的YBCO的初始超导转变温度(T_C)约为45 k,LCCO的T_C接近16 k。在紫外线照射下的LCCO / YBCO双层的进一步测试揭示了结构可以产生凸出的光伏现象。当薄膜经过超导转变时,Pho-Topoltage和光电流经历跳跃,表明LCCO / YBCO界面处的潜在屏障发生变化。这可以归因于接口屏障从PN结类型转换到肖特基结类型。

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