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Phonon-induced dephasing of excitons in semiconductor quantum dots: Multiple exciton generation, fission, and luminescence

机译:声子在半导体量子点中引起激子的相移:多重激子的产生,裂变和发光

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摘要

Phonon-induced dephasing processes that govern optical line widths, multiple exciton (ME) generation (MEG), and ME fission (MEF) in semiconductor quantum dots (QDs) are investigated by ab initio molecular dynamics simulation. Using Si QDs as an example, we propose that MEF occurs by phonon-induced dephasing and, for the first time, estimate its time scale to be 100 fs. In contrast, luminescence and MEG dephasing times are all sub-10 fs. Generally, dephasing is faster for higher-energy and higher-order excitons and increased temperatures. MEF is slow because it is facilitated only by low-frequency acoustic modes. Luminescence and MEG couple to both acoustic and optical modes of the QD, as well as ligand vibrations. The detailed atomistic simulation of the dephasing processes advances understanding of exciton dynamics in QDs and other nanoscale materials.
机译:通过从头算分子动力学模拟研究了声子诱导的相移过程,该相移过程控制着光学线宽,半导体量子点(QD)中的多激子(ME)生成(MEG)和ME裂变(MEF)。以Si量子点为例,我们提出MEF是由声子引起的移相而产生的,并且首次估计其时间尺度为100 fs。相反,发光和MEG移相时间都小于10 fs。通常,对于高能量,高阶激子和温度升高,移相速度更快。 MEF很慢,因为它仅由低频声学模式提供帮助。发光和MEG耦合到QD的声学和光学模式,以及配体振动。移相过程的详细原子模拟可进一步了解量子点和其他纳米级材料中的激子动力学。

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