Atomic force microscopy with interferometric method for detection of the cantilever displacement and its application for low-temperature studies

摘要

Specific features of the atomic force microscopes (AFM) with interferometric method of the cantilever displacement detections are considered in aspects of their applications for low temperature measurements in contact regimes. Brief comparison of interferometric detection with other methods of the cantilever displacement measurements is provided. A developed approach of Young's modulus determination for AFM with interferometric cantilever-detection system is presented. Experimental results obtained on the temperature dependence of elastic properties of the AFM cantilever are used for explanation of a weak temperature dependence of the ferroelectric domain dynamics in thin ferroelectric films, previously observed by piezoresponse force microscopy.