首页> 外文期刊>Advanced Science Letters >Investigating the Properties of ZnO-Al_2O_3-Y_2O_3 Transparent Conductive Metal Oxide Thin Films Prepared by E-Beam Physical Vapor Deposition
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Investigating the Properties of ZnO-Al_2O_3-Y_2O_3 Transparent Conductive Metal Oxide Thin Films Prepared by E-Beam Physical Vapor Deposition

机译:电子束物理气相沉积法制备ZnO-Al_2O_3-Y_2O_3透明导电金属氧化物薄膜的性能研究

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摘要

A ZnO-Al_2O_3-Y_2O_3 (AZYO) ternary compound was sintered at 1100℃ as a target and deposited on glass using an electron beam evaporation system. The effects of substrate temperature (25~110℃) and deposition (oxygen) pressure (1 × 10~(-3) Torr and 1 × 10~(-4) Torr) on deposition rate, morphology, roughness, resistivity, and optical transmission spectrum were studied. The deposition rate increased as the oxygen pressure increases from 1 × 10~(-4) Torr to 1 × 10~3 Torr and the deposition rate linearly decreased with increasing deposition temperature. From the XRD patterns, all the AZYO thin films still exhibited the (002) peak at around 20 = 34.40°. The Burstein-Moss shift was observed and used to prove that defects in the AZYO thin films decreased with increasing substrate temperature. The value variations in the band gap energy (E_g) of the AZYO thin films were evaluated from plots of (αhv)~(1/2) versus energy. The measured E_g values increased with increasing substrate temperature and slightly increased with increasing oxygen pressure.
机译:以1100℃为目标烧结ZnO-Al_2O_3-Y_2O_3(AZYO)三元化合物,并通过电子束蒸发系统沉积在玻璃上。基板温度(25〜110℃)和沉积(氧气)压力(1×10〜(-3)Torr和1×10〜(-4)Torr)对沉积速率,形貌,粗糙度,电阻率和光学性能的影响研究了透射光谱。沉积速率随着氧气压力从1×10〜(-4)Torr增加到1×10〜3 Torr而增加,并且沉积速率随沉积温度的升高而线性降低。从XRD图谱来看,所有AZYO薄膜仍在20 = 34.40°处显示(002)峰。观察到Burstein-Moss位移,并用来证明AZYO薄膜中的缺陷随着衬底温度的升高而降低。根据(αhv)〜(1/2)与能量的关系图评估了AZYO薄膜的带隙能量(E_g)的值变化。测得的E_g值随基材温度升高而增加,随氧气压力升高而略有增加。

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