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首页> 外文期刊>Archives of Metallurgy and Materials >TRANSIENT LIQUID PHASE BEHAVIOR OF Sn-COATED Cu PARTICLES AND CHIP BONDING USING PASTE CONTAINING THE PARTICLES
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TRANSIENT LIQUID PHASE BEHAVIOR OF Sn-COATED Cu PARTICLES AND CHIP BONDING USING PASTE CONTAINING THE PARTICLES

机译:使用含有颗粒的浆料的Sn涂覆的Cu颗粒和芯片键合的瞬态液相行为

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摘要

Sn-coated Cu particles were prepared as a filler material for transient liquid phase (TLP) bonding. The thickness of Sn coating was controlled by controlling the number of plating cycles. The Sn-coated Cu particles best suited for TLP bonding were fabricated by Sn plating thrice, and the particles showed a pronounced endothermic peak at 232 degrees C. The heating of the particles for just 10 s at 250 degrees C destroyed the initial core-shell structure and encouraged the formation of Cu-Sn intermetallic compounds. Further, die bonding was also successfully performed at 250 degrees C under a slight bonding pressure of around 0.1 MPa using a paste containing the particles. The bonding time of 30 s facilitated the bonding of Sn-coated Cu particles to the Au surface and also increased the probability of network formation between particles.
机译:制备Sn涂覆的Cu颗粒作为瞬态液相(TLP)键合的填料。 通过控制电镀循环的数量来控制Sn涂层的厚度。 通过Sn电镀三次制造最适合于TLP键合的Sn涂覆的Cu颗粒,并且颗粒在232℃下显示出明显的吸热峰。在250℃下颗粒加热颗粒仅为10秒销毁初始核心壳 结构并鼓励形成Cu-Sn金属间化合物。 此外,使用含有颗粒的糊状物在约0.1MPa的轻微粘合压力下在250℃下成功键合成功键合。 30秒的键合时间促进了Sn涂覆的Cu颗粒对Au表面的键合,并且还增加了颗粒之间的网络形成的概率。

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