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首页> 外文期刊>Crystallography reports >New Structure for Photoconductive Antennas Based on {LTG-GaAs/GaAs:Si} Superlattice on GaAs(111)A Substrate
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New Structure for Photoconductive Antennas Based on {LTG-GaAs/GaAs:Si} Superlattice on GaAs(111)A Substrate

机译:<粗体>基于{LTG-GAAS / GAAS :<粗体> SI} GaAs(111)的基于{LTG-GAAS / GACAS :<粗体> SI} SuperLattice

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摘要

The structural characteristics of a new structure for photoconductive antennas have been investigated. This structure is a multilayered epitaxial film grown on a GaAs(111)A substrate; it consists of alternating undoped low-temperature grown GaAs (LTG-GaAs) layers and GaAs layers synthesized in the standard high-temperature regime and doped with silicon (GaAs:Si). The As-4/Ga flow ratio is chosen such as to produce p-type GaAs:Si layers. LTG-GaAs layers were grown at an enlarged value. The samples grown on GaAs(100) substrates were single-crystal, whereas the single-crystal growth on GaAs(111)A substrates changed to polycrystalline when the film thickness reached 320-340 nm. The sizes of As precipitates in annealed samples, their distribution over the film thickness, and specific features of their crystal structure have been analyzed.
机译:研究了用于光电导天线的新结构的结构特征。 该结构是在GaAs(111)的基材上生长的多层外延膜; 它包括交替在标准高温调节中合成的未掺杂的低温生长GaAs(LTG-GaAs)层和GaAs层,并掺杂有硅(GaAs:Si)。 选择AS-4 / GA流量比,例如生产P型GaAs:Si层。 LTG-GaAs层以扩大值生长。 在GaAs(100)基板上生长的样品是单晶,而GaAs(111)上的单晶生长在膜厚度达到320-340nm时改变为多晶。 已经分析了退火样品中的沉淀物的尺寸,它们在膜厚度上分布以及其晶体结构的特定特征。

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  • 来源
    《Crystallography reports》 |2019年第2期|共7页
  • 作者单位

    Russian Acad Sci VG Mokerov Inst Ultra High Frequency Semicond Ele Moscow 117105 Russia;

    Kurchatov Inst Natl Res Ctr Moscow 123182 Russia;

    Kurchatov Inst Natl Res Ctr Moscow 123182 Russia;

    Natl Res Nucl Univ MEPhI Moscow 115409 Russia;

    Natl Res Nucl Univ MEPhI Moscow 115409 Russia;

    Russian Acad Sci VG Mokerov Inst Ultra High Frequency Semicond Ele Moscow 117105 Russia;

    Russian Acad Sci VG Mokerov Inst Ultra High Frequency Semicond Ele Moscow 117105 Russia;

    Russian Acad Sci VG Mokerov Inst Ultra High Frequency Semicond Ele Moscow 117105 Russia;

    Russian Acad Sci VG Mokerov Inst Ultra High Frequency Semicond Ele Moscow 117105 Russia;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 晶体学;
  • 关键词

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