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Effects of illumination on image reconstruction via Fourier ptychography

机译:照明对傅里叶PTYCHOGAL的图像重建的影响

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摘要

The Fourier ptychographic microscopy (FPM) technique provides high-resolution images by combining a traditional imaging system, e.g. a microscope or a 4f-imaging system, with a multiplexing illumination system, e.g. an LED array and numerical image processing for enhanced image reconstruction. In order to numerically combine images that are captured under varying illumination angles, an iterative phase-retrieval algorithm is often applied. However, in practice, the performance of the FPM algorithm degrades due to the imperfections of the optical system, the image noise caused by the camera, etc. To eliminate the influence of the aberrations of the imaging system, an embedded pupil function recovery (EPRY)-FPM algorithm has been proposed [Opt. Express 22, 4960–4972 (2014)]. In this paper, we study how the performance of FPM and EPRY-FPM algorithms are affected by imperfections of the illumination system using both numerical simulations and experiments. The investigated imperfections include varying and non-uniform intensities, and wavefront aberrations. Our study shows that the aberrations of the illumination system significantly affect the performance of both FPM and EPRY-FPM algorithms. Hence, in practice, aberrations in the illumination system gain significant influence on the resulting image quality.
机译:傅里叶PTYCHAPUCH显微镜(FPM)技术通过组合传统的成像系统提供高分辨率图像,例如,显微镜或4F成像系统,具有多路复用照明系统,例如,增强图像重建的LED阵列和数值图像处理。为了在不同的照明角下捕获的数值组合图像,通常应用迭代相位检索算法。然而,在实践中,FPM算法的性能因光学系统的缺陷而降低,由相机等的图像噪声等来消除成像系统的像差的影响,嵌入式瞳孔函数恢复(EPRY )-fpm算法已提出[选择。快递22,4960-4972(2014)]。在本文中,我们研究了FPM和EPRY-FPM算法的性能如何影响使用数值模拟和实验的照明系统的缺陷。调查的缺陷包括不同且不均匀的强度和波前像差。我们的研究表明,照明系统的像差显着影响FPM和EPRY-FPM算法的性能。因此,在实践中,照明系统中的像差对所得到的图像质量产生显着影响。

著录项

  • 来源
    《Advanced Optical Technologies》 |2017年第6期|共8页
  • 作者

    XinruiCao; StefanSinzinger;

  • 作者单位

    Fachgebiet Technische Optik Institut für Mikro- und Nanotechnologien (IMN) MacroNano? Technische Universit?t Ilmenau Postfach 100565 98684 Ilmenau Germany;

    Fachgebiet Technische Optik Institut für Mikro- und Nanotechnologien (IMN) MacroNano? Technische Universit?t Ilmenau Postfach 100565 98684 Ilmenau Germany;

  • 收录信息
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 光学;
  • 关键词

    Fourier ptychography; illumination design; image reconstruction;

    机译:傅里叶PTychography;照明设计;图像重建;

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