Design Methodology of Fault-Tolerant Custom 3D Network-on-Chip

摘要

A systematic design methodology is presented for custom Network-on-Chip (NoC) in three-dimensional integrated circuits (3D-ICs). In addition, fault tolerance is supported in the NoC if extra links are included in the NoC topology. In the proposed method, processors and the communication architecture are synthesized simultaneously in the 3D floorplanning process. 3D-IC technology enables ICs to be implemented in smaller size with higher performance; on the flip side, 3D-ICs suffer yield loss due to multiple dies in a 3D stack and lower manufacturing yield of through-silicon vias (TSVs). To alleviate this problem, a known-good-dies (KGD) test can be applied to ensure every die to be packaged into a 3D-IC is fault-free. However, faulty TSVs cannot be tested in the KGD test. In this article, the proposed method deals with the problem by providing fault tolerance in the NoC topology. The efficiency of the proposed method is evaluated using several benchmark circuits, and the experimental results show that the proposed method produces 3D NoCs with comparable performance than previous methods when fault-tolerant features are not realized. With fault tolerance in NoCs, higher yield can be achieved at the cost of performance penalty and elevated power level.