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Accelerated long-term forgetting in resected and seizure-free temporal lobe epilepsy patients

机译:加速长期忘记切除和癫痫发作的颞叶癫痫患者

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Episodic memory impairments caused by temporal lobe epilepsy (TLE) are well documented in the literature. Standard clinical episodic memory tests typically include a 30-min delayed recall test. However, in the past decade, it has become apparent that this standard test does not capture the full range of memory problems in TLE patients. Some patients perform well on a standard 30-min delayed recall test, but show Accelerated Long-term Forgetting (ALF) after 24 h. Although ALF has been investigated in patients with different types of epilepsy, current research on resected TLE patients is missing. In the present study, resected TLE patients were compared to a control group matched on initial learning. They showed normal performance on verbal recall after 30 min, but impairments became apparent after one week. Moreover, the significant interaction between participant group and memory test delay demonstrated that the patients indeed showed an acceleration in forgetting. Furthermore, ALF was present in both left and right resected TLE patients, which contradicts the presence of material-specific hemispheric differences in ALF. In addition, ALF was observed in seizure-free resected TLE patients, thereby demonstrating that this factor is not crucial for long-term memory deficits. The outcome shows that clinicians are likely to underestimate memory deficits in resected TLE patients and, therefore, advocates for the inclusion of ALF tests in standard clinical batteries for both pre- and post-surgery testing sessions. (C) 2018 Elsevier Ltd. All rights reserved.
机译:由颞叶癫痫(TLE)引起的颞叶内存障碍物在文献中有很好的记录。标准临床情节内存测试通常包括30分钟的延迟召回试验。然而,在过去的十年中,显而易见的是,该标准测试不会捕获TLE患者的全部内存问题。一些患者在标准的30分钟延迟召回测试中表现良好,但在24小时后显示加速长期遗忘(ALF)。虽然ALF已在不同类型的癫痫患者中调查,但目前对切除的TLE患者的研究缺失。在本研究中,将切除的TLE患者与在初始学习中匹配的对照组进行比较。在30分钟后,他们对口头召回的正常表现表现出来,但一周后损伤变得明显。此外,参与者组和记忆试验延迟之间的显着相互作用表明患者确实在遗忘时表现出加速度。此外,ALF存在于左右切除的TLE患者中,这与ALF的物质特异性半球差异相矛盾。此外,ALF在无癫痫发作切除的TLE患者中观察到,从而证明该因素对长期记忆缺陷来说并不至关重要。结果表明,临床医生可能会在切除的TLE患者中低估内存缺陷,因此,倡导在标准临床电池中包含ALF测试,用于预先和手术后测试会话。 (c)2018年elestvier有限公司保留所有权利。

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