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Ground state determination and band gaps of bilayers of graphenylenes and octafunctionalized-biphenylenes

机译:石墨烯烯基和八配碳化 - 联苯二苯基二聚体的地面确定和带空隙

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摘要

Device fabrication often requires materials that are either reliably conducting, reliably semiconducting, or reliably nonconducting. Bilayer graphene (BLG) changes from a superconductor (Cao et al., 2018) to a semiconductor (Ohta et al., 2006) depending on it's stacking, but because it is difficult to control its stacking, it is not a reliable material for device fabrication (Bistritzer and MacDonald, 2011) [4]. Using DFTB+ (Aradi et al., 2007), this work demonstrates that bilayers of graphenylene, net-C, and net-W can be reliably used for device fabrication without knowing the details of their stackings. Bilayers of graphenylene and net-C are semiconducting for all sheer displacements, net-W is conducting for all sheer displacements, while that Type II, like BLG, is conducting or semiconducting depending on the sheer displacement. The method used gives bond lengths, unit cell dimensions, and band dispersion of single-layer graphene that are consistent with previously reported values, it correctly predicts that AB stacking is the ground state of BLG and gives an interlayer separation that is consistent with previous studies. The bond lengths and lattice constants of the other carbon allotropes are consistent with previously published values. In order to calculate the band structures of the bilayer systems, DFTB+ was first used to determined the interlayer separations of the 2-D carbon allotropes under shear displacement.
机译:装置制造通常需要可可靠地传导,可靠半导体或可靠地非导电的材料。双层石墨烯(BLG)从超导体(CAO等,2018)变为半导体(OHTA等,2006),具体取决于它的堆叠,但由于难以控制其堆叠,它不是可靠的材料设备制造(Bistritzer和Macdonald,2011)[4]。使用DFTB +(Aradi等,2007),这项工作表明,石墨烯,NET-C和NET-W的双层可以可靠地用于器件制造而不知道其堆叠的细节。石墨烯和Net-C的双层是全部透明位移的半导体,Net-W正在进行所有纯粹的位移,而II型就像BLG一样,根据纯粹的位移而导致或半导体。使用的方法给出与先前报道的值一致的单层石墨烯的粘合长度,单位细胞尺寸和带分散,它正确预测AB堆叠是BLG的地位,并给出与先前研究一致的层间分离。其他碳异滴级的键长和晶片常数与先前公布的值一致。为了计算双层系统的带结构,首先使用DFTB +来确定剪切位移下的2-D碳偶像的层间分离。

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