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Electrical resistivity of gold thin film as a function of film thickness

机译:金薄膜电阻率作为膜厚度的函数

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摘要

Properties of nano-scale materials are very different from those in bulk form. The electrical resistivity of gold thin film as a function of film thickness is experimentally studied and presented here. The resistivity decreases sharply as thickness increases and approaches the resistivity of bulk gold as thickness of the film exceeds a critical value.
机译:纳米尺度材料的性质与散装形式的物质非常不同。 实验和呈现金薄膜作为膜厚度函数的金薄膜的电阻率。 随着厚度的增加,电阻率随着厚度的增加而接近散装金的电阻率,随着薄膜的厚度超过临界值,散装金的电阻率超过了临界值。

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