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首页> 外文期刊>Journal of Physics, D. Applied Physics: A Europhysics Journal >Enhancement-mode field-effect transistors based on Ti-doped In2O3 nanowires fabricated by electrospinning
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Enhancement-mode field-effect transistors based on Ti-doped In2O3 nanowires fabricated by electrospinning

机译:基于Ti掺杂IN2O3纳米线的增强型现场效应晶体管

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Recently, indium oxide (In2O3) semiconducting nanowires (NWs) have been extensively explored as building blocks for numerous electronic applications. However, most of the fieldeffect transistors (FETs) based on In2O3 NWs were operated in depletion mode (D-mode), which exhibits negative threshold voltage (V-TH) and non-zero current with zero bias. Besides, these devices based on In(2)O(3 )NWs still suffer from high leakage current and low on-off current ratios (I-on/(off)). In this report, high-performance enhancement-mode (E-mode) FETs based on Ti doped In2O3 NWs were successfully integrated. It was found that the device performance could be effectively modulated by adjusting the doping concentration of Ti. The FETs based on In2O3 NWs with Ti doping concentration of 3 mol% exhibited a saturation current of 4.69 x 10(-4) A, a subthreshold swing (SS) of 1.54 V/decade, an on/off current ratio of similar to 1.5 x 10(8), and a field-effect mobility of 2.53 cm(2) V(-1 )s(-1). When high-kappa, ZrOx dielectrics were successfully integrated into the FETs, the mobility and SS of the designed device were improved to 12.67 cm(2) V(-1 )s(-1) and 150 mV/decade, respectively. The inverters based on InTiO NWs/ZrOx FETs were constructed and showed a gain of similar to 9.5. All of these results demonstrate that Ti-doped In2O3 NWs are promising candidates for large-scale, high-performance and low-power electronic devices.
机译:最近,氧化铟(In2O3)半导体纳米线(NWS)已被广泛地探索为许多电子应用的构建块。然而,基于IN2O3 NWS的大多数现场良晶体管(FET)以耗尽模式(D-MODE)操作,其呈现负阈值电压(V-TH)和具有零偏压的非零电流。此外,基于(2)O(3)NWS的这些器件仍然遭受高漏电流和低开关电流比(I-ON /(OFF))。在本报告中,基于TI掺杂IN2O3 NWS的高性能增强模式(E-MODE)FET被成功集成。发现通过调节Ti的掺杂浓度,可以有效地调节装置性能。基于In2O3 NWS的FET具有3mol%的Ti掺杂浓度显示为4.69×10(-4)A的饱和电流,亚阈值摆动(SS)为1.54 v /十年,接通/关闭电流比与1.5相似X 10(8),以及2.53cm(2)V(-1)S(-1)的场效期迁移率。当高κA,Zrox电介质成功集成到FET中,设计装置的迁移率和SS分别改善为12.67cm(2)V(-1)S(-1)和150 mV /十年。构建基于INTIO NWS / ZROX FET的逆变器,并显示出类似于9.5的增益。所有这些结果表明,Ti-Doped In2O3 NW是大规模,高性能和低功耗电子设备的候选者。

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