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首页> 外文期刊>Journal of Physics, D. Applied Physics: A Europhysics Journal >Comparison of optoelectrical characteristics between Schottky and Ohmic contacts to beta-Ga2O3 thin film
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Comparison of optoelectrical characteristics between Schottky and Ohmic contacts to beta-Ga2O3 thin film

机译:肖特基与欧姆触点与β-GA2O3薄膜的光电特性比较

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摘要

Schottky and Ohmic contacts are key matters affecting carrier transport in oxide semiconductor-based electrical and optical devices. For Ga2O3, the comparison of optoelectrical behaviors and the fundamental physical mechanism between these two contacts are not well known yet. In this work, beta-Ga2O3 thin films were grown via metal-organic chemical vapor deposition then deposited with symmetrical Ni/Au (Schottky) or Ti/Au (Ohmic) contacts. Optoelectrical measurements show that the Ohmic contacted device exhibits superior responsivities thanks to its higher photocurrents. Meanwhile, for the Schottky contacted device, firstly, it has a faster response speed, and secondly it exhibits larger photo-to-dark current ratios owing to their low dark current. Specifically, the voltage- and light intensity-dependent responsivity and detectivities of the Schottky and Ohmic contacted devices were measured and discussed under the consideration of different voltages and UV light intensities.
机译:肖特基和欧姆触点是影响基于氧化物半导体的电气和光学装置的载流子传输的关键问题。 对于Ga2O3,光电行为的比较和这两个触点之间的基本物理机制尚未公知。 在这项工作中,通过金属 - 有机化学气相沉积生长β-Ga2O3薄膜,然后用对称的Ni / Au(肖特基)或Ti / Au(欧姆)触点沉积。 光电测量表明,由于其较高的光电流,欧姆接触装置表现出优异的响应性。 同时,对于肖特基接触的装置,首先,它具有更快的响应速度,其次,由于其低暗电流,它表现出更大的光照电流比率。 具体地,测量肖特基和欧姆接触装置的电压和光强度依赖性响应性和检测,并在考虑不同的电压和UV光强度下进行讨论。

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