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Highly sensitive free-base-porphyrin-based thin-film optical waveguide sensor for detection of low concentration NO2 gas at ambient temperature

机译:基于高度敏感的自由基卟啉基薄膜光波导传感器,用于在环境温度下检测低浓度NO2气体

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摘要

Meso-5,10,15,20-tetrakis-(4-tertbutyl phenyl) porphyrin was synthesized using Adler-Longo method and was served as sensing material. Electronic absorption spectra of the porphyrin chloroform solution and its thin film were studied comparatively. An optical waveguide sensor based on free-base porphyrin was fabricated by spin coating method. Absorption variation of porphyrin film was studied before and after exposure to NO2, H2S, SO2, and volatile organic gases. XRD patterns of porphyrin film before and after exposure to analytes (NO2, SO2, and H2S) were provided, and light source of the OWG testing system was selected. This facile-prepared sensor exhibited high sensitivity and selectivity to NO2 with fast response time of 3 s and slow recovery time of 10 min or so and was capable of measuring NO2 down to 10 ppb at ambient temperature. Scanning electron microscopy was employed to characterize film morphology before and after contact with NO2. Film thickness was measured before (71.3 nm) and after (76.8 nm) exposure to NO2, and film thickness variation value (5.20 nm) was calculated. The sensing behavior of the studied sensing device was tested through mixture of H2S, SO2, and VOC gases with NO2 and without NO2 for determination of the selectivity of the device. Film stability was probed by UV-Vis spectra, and response values of sensing element to NO2 gas were detected after several days of film preparation, and its RSD value was 1.66%.
机译:使用Adler-Longo方法合成Meso-5,10,15,20-四(4-叔丁基苯基)卟啉,用作传感材料。对卟啉氯仿溶液的电子吸收光谱和其薄膜相对较好。通过旋涂法制造基于自由碱卟啉的光波导传感器。在暴露于NO2,H 2 S,SO 2和挥发性有机气面之前和之后研究了卟啉膜的吸收变化。提供暴露于分析物(NO 2,SO2和H2S)之前和之后的卟啉膜的XRD图案,选择OWG测试系统的光源。该容易制备的传感器具有高灵敏度和选择性,在NO 2中,快速响应时间为3 s,缓慢恢复时间为10分钟左右,并且在环境温度下能够测量NO 2至10ppb。使用扫描电子显微镜检查与NO2接触前后的薄膜形态。在(71.3nm)之前测量膜厚度和在NO 2暴露(76.8nm)之后,计算膜厚度变化值(5.20nm)。通过H 2 S,SO2和VOC气体的混合物测试所研究的感测装置的感测行为,其中NO 2和没有NO2用于确定装置的选择性。通过UV-VIS光谱探测薄膜稳定性,并且在几天的薄膜制剂后检测到感测元件对NO2气体的响应值,其RSD值为1.66%。

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  • 来源
    《Journal of Materials Science》 |2018年第15期|共13页
  • 作者单位

    Xinjiang Univ Coll Chem &

    Chem Engn Urumqi 830046 Peoples R China;

    Xinjiang Univ Coll Chem &

    Chem Engn Urumqi 830046 Peoples R China;

    Xinjiang Univ Coll Chem &

    Chem Engn Urumqi 830046 Peoples R China;

    Xinjiang Univ Coll Chem &

    Chem Engn Urumqi 830046 Peoples R China;

    Xinjiang Univ Coll Chem &

    Chem Engn Urumqi 830046 Peoples R China;

    Xinjiang Univ Coll Chem &

    Chem Engn Urumqi 830046 Peoples R China;

    Xinjiang Univ Coll Chem &

    Chem Engn Urumqi 830046 Peoples R China;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 工程材料学;
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