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GaN codoping and annealing on the optoelectronic properties of SnO2 thin films

机译:GaN编排和退火对SnO2薄膜的光电性质

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摘要

Transparent GaN doped SnO2 thin films were deposited on glass substrates by e-beam evaporation with GaN: SnO2 targets of various GaN weight ratios. The effects of doping level and annealing temperature on the optoelectronic properties of GaN codoped SnO2 thin films were investigated. A conversion from n-type conduction to p-type was observed for GaN doped thin films upon annealing at 440 degrees C regardless doping level. However, it converted back to n-type conduction at various higher temperatures depending on GaN doping levels. Hole concentration for p-type GaN: SnO2 thin films could be achieved as high as 1.797 x 10(19) cm(-3) because of the codoping of Ga and N. Hall measurements showed that upon proper thermal treatments, Ga3+-Sn4+ and N3--O2- substitution reactions occurred in the thin films, which regulated the polarity of conduction and carrier concentration. The formation of N-o substitutions in the GaN:SnO2 thin films and decomposition of them at certain higher temperature were mainly responsible for the n-p-n conduction transition. (C) 2017 Elsevier B.V. All rights reserved.
机译:透明GaN掺杂SnO2薄膜通过e-束蒸发沉积在玻璃基板上,通过GaN蒸发:SnO2各种GaN重量比的靶标。研究了掺杂水平和退火温度对GaN编排的SnO2薄膜光电性能的影响。对于在440℃的退火时,观察到从n型传导到p型的转化为440℃,无论掺杂水平。然而,根据GaN掺杂水平,它在各种较高温度下转换回N型传导。 p型GaN的空穴浓度:SnO2薄膜可以高达1.797×10(19)厘米(-3),因为Ga和N.Hall测量结果显示,在适当的热处理时,Ga3 + -Sn4 +和N3 - O 2-取代反应发生在薄膜中,其调节导通和载流子浓度的极性。 GaN中的N-O取代的形成:SnO2薄膜和在某些较高温度下它们的分解主要负责N-P-N导通转变。 (c)2017年Elsevier B.V.保留所有权利。

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