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首页> 外文期刊>The journal of physical chemistry, C. Nanomaterials and interfaces >Photoreduction of Hydrogen Cations on TiO2 and Its Impact on Surface Band Bending and the Charge Carrier Recombination Rate: A Photoluminescence Study under High Vacuum Conditions
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Photoreduction of Hydrogen Cations on TiO2 and Its Impact on Surface Band Bending and the Charge Carrier Recombination Rate: A Photoluminescence Study under High Vacuum Conditions

机译:TiO2氢阳离子的光射及其对表面带弯曲的影响及电荷载体重组率:高真空条件下的光致发光研究

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摘要

The interaction between hydrogen species and TiO2 surfaces is important because of its relevance to hydrogen production in the photocatalytic splitting of water on TiO2. In this study, the effect of the photocatalytic reduction of hydrogen cations, a half photoelectrochemical reaction run under high vacuum conditions, on the surface band bending of TiO2 was investigated by photoluminescence (PL) spectroscopy. Exposure of TiO2 to molecular hydrogen had no effect on the PL emission from TiO2, but the PL intensity increased under UV irradiation when TiO2 was exposed to hydrogen cations produced by ionization of molecular hydrogen by a cold cathode pressure gauge. The PL intensity increase, signaling a decrease in the upward band bending and increased electron-hole radiative recombination rate, is caused by charge transfer during photoreduction of hydrogen cations. Residual photoexcited holes left in TiO2 due to the transfer of photoexcited electrons to hydrogen cations tend to accumulate at the TiO2 surface, balancing the originally trapped electrons at the TiO2 surface and thereby lowering the original upward band bending. These unusual observations point out that charge transfer during a photoelectrochemical reaction at a semiconductor interface alters the surface band bending and photoexcited electron-hole recombination rate in ways that are likely to impact the efficiency of photocatalytic devices.
机译:氢物质和TiO2表面之间的相互作用是重要的,因为它与TiO 2上水的光催化分裂中的氢气产生的相关性。在本研究中,通过光致发光(PL)光谱研究了在高真空条件下,在高真空条件下,光催化还原氢阳离子的影响,半光电子化学反应在TiO 2的表面带弯曲中进行。 TiO 2暴露于分子氢对TiO 2的PL发射没有影响,但是当通过冷阴极压力计通过离子氢的电离产生的氢阳离子时,PL强度在紫外线照射时增加。 PL强度增加,信号传递向上带弯曲和增加的电子空穴辐射重组率,是由氢阳离子的光电拍摄期间的电荷转移引起的。由于将光屏蔽电子传递到氢阳离子而留在TiO2中的残余光屏蔽孔倾向于在TiO 2表面上积聚,平衡在TiO2表面处的最初捕获的电子,从而降低原始向上带弯曲。这些不寻常的观察结果指出,半导体界面处的光电化学反应期间的电荷转移改变了表面带弯曲和光透镜的电子 - 空穴重组率,其可能影响光催化装置的效率。

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