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Spin-orbit coupling effects on predicting defect properties with hybrid functionals: A case study in CdTe

机译:旋转轨道耦合效应对Hybrid功能预测缺陷性质的影响:CDTE中的案例研究

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摘要

Defect formation energies and transition levels are critical in determining doping behavior and recombination in semiconductor applications. Hybrid functionals are often used to overcome the band gap and delocalization errors of standard density-functional theory, and it is tempting to presume that the defect properties are correctly predicted once the hybrid functional mixing parameter reproduces the experimental band gap. However, pronounced spin-orbit coupling (SOC) effects can have an additional important role, which is clearly shown in this work by analyzing SOC effects originating from the Te-p orbitals in CdTe. In this work, we therefore use a hybrid functional that reproduces the experimental band gap when SOC is included, requiring a larger mixing parameter alpha = 0.33 compared to the conventional choice of alpha = 0.25. This hybrid functional was then used to predict defect properties, e.g., formation energy, transition level, and defect equilibrium. For defect states that do not directly involve the Te-p orbitals, such as the Cd interstitial (Cd-i), we find that the effect of SOC on the defect levels can be captured by simply considering the SOC-induced band-edge shift. This is not the case for the A center (Cl-Te - V-Cd defect pair), where the localized acceptor state formed by Te-p orbitals is more directly affected by the SOC. For this defect, a mixing parameter as large as alpha = 0.40 is required to reproduce the experimental acceptor level. Regarding the implications for photovoltaics, we suggest that the Cd-i, which is the dominant compensating donor, could play an important role as a recombination center. While Cd-i is usually thought of as a benign shallow donor, our predicted defect levels in the fully band-gap-corrected calculations are deep enough to raise a concern, and we propose a recombination mechanism for electron capture by Cd-i.
机译:缺陷形成能量和过渡水平对于确定半导体应用中的掺杂行为和重组至关重要。混合功能通常用于克服标准密度功能理论的带隙和临近缺陷误差,并且诱人诱人在混合功能混合参数再现实验带隙时正确预测缺陷性能。然而,发音旋转轨道耦合(SOC)效应可以具有额外的重要作用,通过分析来自CDTE中的TE-P轨道的SOC效果,清楚地示出了这项工作。在这项工作中,我们使用混合功能,该混合功能在包括SOC时再现实验带隙,与常规选择的alpha = 0.25相比,需要更大的混合参数α= 0.33。然后使用该杂交功能来预测缺陷性质,例如形成能量,过渡水平和缺陷平衡。对于不直接涉及TE-P轨道的缺陷状态,例如CD口交(CD-I),我们发现SOC的效果可以通过简单地考虑SOC诱导的带边偏移来捕获缺陷级别。这不是一种中心(CL-TE - V-CD缺陷对)的情况,其中TE-P轨道形成的局部受体状态更直接受SOC的影响。对于这种缺陷,需要像alpha = 0.40一样大的混合参数来再现实验受体水平。关于对光伏的影响,我们建议作为主要补偿捐赠者的CD-I可以发挥重要作用作为重组中心。虽然CD-I通常被认为是良性浅捐赠者,但我们完全带隙校正的计算中的预测缺陷水平足以提高关注,并且我们提出了通过CD-I捕获电子捕获的重组机制。

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  • 来源
    《Physical review, B》 |2018年第5期|共9页
  • 作者单位

    Natl Renewable Energy Lab Mat Sci Ctr Golden CO 80401 USA;

    Natl Renewable Energy Lab Mat Sci Ctr Golden CO 80401 USA;

    Natl Renewable Energy Lab Mat Sci Ctr Golden CO 80401 USA;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 固体物理学;
  • 关键词

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