The cantilever beam magnetometer (CBM) is an apparatus by means of which in situ measurement of the mechanical and magnetic properties of thin films can be made. We report here on the development of a cost-effective home-built CBM set-up under the high vacuum conditions and demonstrate its ability to measure intrinsic stress during the growth of magneticon-magnetic thin films and thereafter the magnetization of the magnetic films as a function of the magnetic field. The reproducible performance ofthe set-up has been demonstrated with various magnetic and non-magnetic films deposited on the p-Si(100) substrates.
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