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Theoretical model of the helium zone plate microscope

机译:氦区钢板显微镜的理论模型

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Neutral helium microscopy is a new technique currently under development. Its advantages are the low energy, charge neutrality, and inertness of the helium atoms, a potential large depth of field, and the fact that at thermal energies the helium atoms do not penetrate into any solid material. This opens the possibility, among others, for the creation of an instrument that can measure surface topology on the nanoscale, even on surfaces with high aspect ratios. One of the most promising designs for helium microscopy is the zone plate microscope. It consists of a supersonic expansion helium beam collimated by an aperture (skimmer) focused by a Fresnel zone plate onto a sample. The resolution is determined by the focal spot size, which depends on the size of the skimmer, the optics of the system, and the velocity spread of the beam through the chromatic aberrations of the zone plate. An important factor for the optics of the zone plate is the width of the outermost zone, corresponding to the smallest opening in the zone plate. The width of the outermost zone is fabrication limited to around 10 nm with present-day state-of-the-art technology. Due to the high ionization potential of neutral helium atoms, it is difficult to build efficient helium detectors. Therefore, it is crucial to optimize the microscope design to maximize the intensity for a given resolution and width of the outermost zone. Here we present an optimization model for the helium zone plate microscope. Assuming constant resolution and width of the outermost zone, we are able to reduce the problem to a two-variable problem (zone plate radius and object distance) and we show that for a given beam temperature and pressure, there is always a single intensity maximum. We compare our model with the highest-resolution zone plate focusing images published and show that the intensity can be increased seven times. Reducing the width of the outermost zone to 10 nm leads to an increase in intensity of more than 8000 times. Finally, we show that with present-day state-of-the-art detector technology (ionization efficiency 1 x 10(-3)), a resolution of the order of 10 nm is possible. In order to make this quantification, we have assumed a Lambertian reflecting surface and calculated the beam spot size that gives a signal 100 cts/s within a solid angle of 0.02 sr, following an existing helium microscope design.
机译:中性氦显微镜正在开发中目前的新技术。它的优点是低能量,电荷中性,和惰性的氦原子的,一个潜在的大景深,而事实上,在热能量氦原子不渗透到任何固体材料。这将打开的可能性,除其他外,用于产生可以测量在纳米尺度表面拓扑结构,即使是在具有高纵横比的表面的仪器。一个氦显微镜最有前途的设计是带片显微镜。它由通过孔(撇渣器)准直一个超声膨胀氦光束的聚焦由菲涅耳带片上的样品。分辨率由焦斑尺寸,这取决于蛋白质分离器的尺寸,该系统的光学元件,并通过带片的色像差的光束的传播速度来确定。对于带片的光学器件的一个重要因素是最外面的圈的宽度,对应于所述带片的最小开口。最外面的圈的宽度被制造限于10nm左右与当今的状态的最先进的技术。由于中性氦原子的高电离电位,难以建立有效的氦气探测器。因此,关键的是要优化显微镜设计以最大化强度对于给定的分辨率和宽的最外区。在这里,我们提出了氦带片显微镜的优化模型。假定恒定的分辨率和最外区的宽度,我们能够减少的问题为两变量的问题(带片半径和对象的距离)和,我们表明,对于给定的波束的温度和压力,总有一个单一的强度最大。我们比较我们与最高分辨率的带片模式聚焦图像公布,并表明,强度可提高七倍。减少最外区至10nm引线的宽度的增加超过8000倍的强度。最后,我们表明,与当今的状态的最先进的技术检测器(电离效率1×10(-3)),10纳米量级的分辨率是可能的。为了使该定量,我们假定朗伯反射表面和计算出的束斑尺寸,给出了一个信号100个CTS /秒0.02 SR的立体角内,下列现有氦显微镜设计。

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