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Finite element modeling of single-lap joint between GdBa2Cu3O7-x-coated conductors using cohesive elements

机译:使用粘性元素GDBA2CU3O7-X型导体单圈接头的有限元模拟

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摘要

Both the initiation of cracking and delamination growth have been observed in the joints between the GdBCO-coated conductors, which causes the degradation of electrical property irreversibly. In this paper, firstly, the tension (lap-shear) test of the single-lap joint is simulated to verify the selected material properties and the numerical model. Then, the delamination behavior of the single-lap joint between the GdBCO-coated conductors is investigated based on the cohesive model. The multiple layers of zero thickness cohesive elements are implemented within the tapes and interfaces between the tape and solder. Different boundary conditions are also considered to determine the corresponding delamination position and value of debonding load. With the classical beam theory and linear elastic fracture mechanics, the approximate analytical solution is given to throw light on the behavior of the joint. The numerical results show that the interface parameters such as cohesive strength can affect the positions of crack formation and stable extension of crack. In addition, the debonding load is influenced by the overlap length of the joint and constraint condition.
机译:在GDBCO涂覆的导体之间的关节中观察到裂化和分层生长的起始,这导致电性能不可逆地降解。在本文中,首先,模拟了单圈接头的张力(圈剪切)试验以验证所选择的材料特性和数值模型。然后,基于粘性模型研究了GDBCO涂覆的导体之间的单圈接头的分层行为。多层零厚度粘性元件在带和焊料之间的胶带和接口内实现。还考虑了不同的边界条件来确定相应的分层位置和借助负荷的值。利用经典光束理论和线性弹性断裂力学,给出了近似分析解决方案,以抛光接头的行为。数值结果表明,诸如粘性强度的界面参数可以影响裂缝形成和稳定的裂缝延伸。此外,剥离负载受关节和约束条件的重叠长度的影响。

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