...
首页> 外文期刊>Synthetic Metals >Hole mobility and conductance of iridium complex doped NPB emission layers for organic light-emitting diodes
【24h】

Hole mobility and conductance of iridium complex doped NPB emission layers for organic light-emitting diodes

机译:用于有机发光二极管的铱络合物掺杂NPB发射层的空穴迁移率和电导

获取原文
获取原文并翻译 | 示例
           

摘要

Iridium complexes are widely used in dye phosphorescent guest-host systems which usually as emission layer of efficient organic light-emitting diodes. Phosphorescent organic light-emitting diodes (OLEDs) with tris(2-phenylpyridine) iridium [Ir(ppy)(3)] as emissive dopant exhibited high internal quantum efficiency. N, N-diphenyl-N, N-bis(1-naphthylphenyl)-1,1-biphenyl-4,4-diamine (NPB) is a good candidate of host for guest-host system in OLEDs. It is significant that understanding and engineering of charge transport in Ir(ppy)(3) doped NPB films to design and optimize OLEDs, even organic lasers. In this paper, hole mobility and conductance of Ir(ppy)(3 )doped NPB films were investigated by admittance spectroscopy. The results show that for a given applied voltage, with the doping concentration increasing, the conductance first increase reaching a maximum then decrease, which indicate that light doping of NPB with Ir(ppy)(3 )weakly improves, while heavy doping deteriorates the conductivity. We found that light doping of NPB with Ir(ppy)(3) almost do not alter the hole mobility, which coincides with the previous theory. It is concluded that for films thinner than 300 nm, the electric field dependence of hole mobility is negative, that is, the mobility decrease, rather than increase, near exponentially with the square root of the electric field.
机译:铱络合物被广泛应用于磷光染料宾 - 主系统,其通常是作为有效的有机发光二极管的发光层。磷光有机发光二极管(OLED)具有Tris(2-苯基吡啶)铱[IR(PPY)(3)]作为发射掺杂剂表现出高的内部量子效率。 N,N-二苯基-N,N-BIS(1-萘基苯基)-1,1-联苯基-4,4-二胺(NPB)是OLED中客体宿主系统的良好候选者。重要的是,IR(PPY)(3)掺杂NPB薄膜的电荷运输的理解和工程设计和优化OLED,甚至有机激光器。在本文中,通过导纳光谱研究了IR(PPY)(3)掺杂NPB膜的空穴迁移率和电导。结果表明,对于给定的施加电压,随着掺杂浓度的增加,电导首先增加达到最大值,然后降低,这表明NPB与IR(PPY)(3)弱掺杂,而重掺杂劣化导电性劣化。我们发现用IR(PPY)(3)的NPB光掺杂几乎不会改变空穴移动性,这与前一个理论一致。得出结论:对于薄膜薄于300nm,空穴迁移率的电场依赖性是负的,即迁移率降低,而不是增加与电场的平方根逐渐增加。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号